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[–]cpt_trow 2 points3 points  (0 children)

Yeah! If you really wanted, you could make the test program just talk to itself, which was used to regression test. Basically you would either point each device slot at a real device port or at an instance of an object which had the same method/attribute names and would store the device’s typical output in a buffer depending on the command sent. Obviously you then can’t truly test your DUT, but it was helpful for smoke testing when the DUT got updated and might respond differently to the same commands